Tag Archives: X-ray Diffraction Measurement

Measurement Of Compressive Residual Stress Using X-ray Diffraction

A sub-surface compressive residual stress profile is measured using x-ray diffraction measuring equipment.

The X-axis is the measurement of the depth in mm or inches the Y-axis is measure of residual stress in ksi or MPa.

Rösler “in house” laboratory, x-ray diffraction measuring equipment
Rösler “in house” laboratory, x-ray diffraction measuring equipment

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Rösler Invests In Their Own X-Ray Diffractometer For Precise Measurements

Shot peening increases the fatigue life of components exposed to dynamic stress, for example, of a toothed gear component
Shot peening increases the fatigue life of components exposed to dynamic stress, for example, of a toothed gear component

Shot Peening – for longer component life

The strength and service life of components exposed to high dynamic stresses can be significantly improved by shot peening. In order to be able to quickly develop tailor made shot peening solutions for their customers, Rősler now have their own in house testing facility in Memmelsdorf.

Continue reading Rösler Invests In Their Own X-Ray Diffractometer For Precise Measurements